Performance and data analysis aspects of the new DIII-D monostatic profile reflectometer system
Author(s) -
L. Zeng,
W. A. Peebles,
E. J. Doyle,
T. L. Rhodes,
N. A. Crocker,
X. Nguyen,
C. Wannberg,
G. Wang
Publication year - 2014
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.4889775
Subject(s) - reflectometry , optics , diii d , physics , plasma diagnostics , microwave imaging , broadband , microwave , polarization (electrochemistry) , polarimetry , plasma , tokamak , computer science , scattering , time domain , chemistry , quantum mechanics , computer vision
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