Carrier transport properties of nanocrystalline Er3N@C80
Author(s) -
Yong Sun,
Yuki Maeda,
Hiroki Sezaimaru,
Masamichi Sakaino,
Kenta Kirimoto
Publication year - 2014
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.4887796
Subject(s) - nanocrystalline material , materials science , ohmic contact , charge carrier , condensed matter physics , activation energy , scattering , phonon scattering , semiconductor , phonon , dielectric , ionic bonding , analytical chemistry (journal) , optoelectronics , chemistry , nanotechnology , ion , optics , physics , organic chemistry , layer (electronics) , chromatography
Electrical transport properties of the nanocrystalline Er3N@C80 with fcc crystal structure were characterized by measuring both temperature-dependent d.c. conductance and a.c. impedance. The results showed that the Er3N@C80 sample has characteristics of n-type semiconductor and an electron affinity larger than work function of gold metal. The Er3N@C80/Au interface has an ohmic contact behavior and the contact resistance was very small as compared with bulk resistance of the Er3N@C80 sample. The charge carriers in the sample were thermally excited from various trapped levels and both acoustic phonon and ionic scatterings become a dominant process in different temperature regions, respectively. At temperatures below 250 K, the activation energy of the trapped carrier was estimated to be 35.5 meV, and the ionic scattering was a dominant mechanism. On the other hand, at temperatures above 350 K, the activation energy was reduced to 15.9 meV, and the acoustic phonon scattering was a dominant mechanism. In addition, a polarization effect from the charge carrier was observed at low frequencies below 2.0 MHz, and the relative intrinsic permittivity of the Er3N@C80 nanocrystalline lattice was estimated to be 4.6 at frequency of 5.0 MHz
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