Open AccessKapitza resistance of Si/SiO2 interface
Author(s) -
B. Deng,
Aleksandr Chernatynskiy,
Marat Khafizov,
D. H. Hurley,
Simon R. Phillpot
Publication year - 2014
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.4867047
Subject(s) - phonon , interfacial thermal resistance , heterojunction , anharmonicity , condensed matter physics , interface (matter) , wave packet , materials science , thermal resistance , physics , thermal , composite material , thermodynamics , quantum mechanics , capillary number , capillary action
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom