Multiple-interface tracking of degradation process in organic photovoltaics | Zendy

Cindy X. Zhao | Zendy; Lucy L. Deng | Zendy; Y. Matthew | Zendy; Joseph R. Kish | Zendy; Gu Xu | Zendy

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Multiple-interface tracking of degradation process in organic photovoltaics

Author(s) -

Cindy X. Zhao,

Lucy L. Deng,

Y. Matthew,

Joseph R. Kish,

Gu Xu

Publication year - 2013

Publication title -

aip advances

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.421

H-Index - 58

ISSN - 2158-3226

DOI - 10.1063/1.4826586

Subject(s) - degradation (telecommunications) , photovoltaics , materials science , capacitance , interface (matter) , electrical impedance , dielectric spectroscopy , optoelectronics , organic solar cell , electrode , nanotechnology , photovoltaic system , computer science , electrical engineering , chemistry , polymer , composite material , telecommunications , engineering , electrochemistry , capillary number , capillary action

The investigation of the stability in organic photovoltaics has been focused on individual components via localized and destructive analysis, which is limited to broken devices, instead of an operational OPV, and unable to obtain correlated information of degrading interfaces. DC biased AC impedance spectroscopy is employed here, to track multi-interface degradation without breaking the device. By varying DC bias, individual interface degradation is revealed via current density and capacitance versus voltage plots. While one of the impedance semicircles is linked to the interface of P3HT:PCBM, the other represented the interface between the mixture and metal electrode, involving metal oxide in an aged device. The results confirm that, more than one degradation process take place simultaneously at individual interfaces

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