Acoustic spectroscopy for studies of vitreous silica up to 740 GHz | Zendy

KungHsuan Lin | Zendy; Dzung-Han Tsai | Zendy; Kuan-Jen Wang | Zendy; ShengHui Chen | Zendy; Kai-Lun Chi | Zendy; Jin Shi | Zendy; Po Cheng Chen | Zendy; JinnKong Sheu | Zendy

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Acoustic spectroscopy for studies of vitreous silica up to 740 GHz

Author(s) -

KungHsuan Lin,

Dzung-Han Tsai,

Kuan-Jen Wang,

ShengHui Chen,

Kai-Lun Chi,

Jin Shi,

Po Cheng Chen,

JinnKong Sheu

Publication year - 2013

Publication title -

aip advances

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.421

H-Index - 58

ISSN - 2158-3226

DOI - 10.1063/1.4816800

Subject(s) - spectroscopy , attenuation , materials science , raman spectroscopy , terahertz radiation , acoustic attenuation , optics , scattering , optoelectronics , physics , quantum mechanics

Due to the high attenuation in vitreous silica, acoustic attenuations in the THz regime are typically measured by incoherent techniques such as Raman, neutron, and X-ray scattering. Here, we utilized multiple-quantum-well structures to demonstrate acoustic spectroscopy of vitreous silica up to ∼740 THz. The acoustic properties of silica thin films prepared by physical and chemical deposition methods were characterized in the sub-THz regime. This technique can be useful in resolving debated issues relating to Boson peak around 1 THz

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