Small angle x-ray scattering and electron microscopy of nanoparticles formed in an electrical arc | Zendy

Erwann Carvou | Zendy; J.L. Le Garrec | Zendy; Javier Pérez | Zendy; J. Praquin | Zendy; M. Djeddi | Zendy; James B. Mitchell | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

Small angle x-ray scattering and electron microscopy of nanoparticles formed in an electrical arc

Author(s) -

Erwann Carvou,

J.L. Le Garrec,

Javier Pérez,

J. Praquin,

M. Djeddi,

James B. Mitchell

Publication year - 2013

Publication title -

aip advances

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.421

H-Index - 58

ISSN - 2158-3226

DOI - 10.1063/1.4799061

Subject(s) - materials science , small angle x ray scattering , transmission electron microscopy , nanoparticle , electric arc , scattering , electrode , scanning electron microscope , electron microscope , optics , nanotechnology , analytical chemistry (journal) , composite material , chemistry , physics , chromatography

Small Angle X-ray Scattering has been used to characterize nanoparticles generated by electrical arcing between metallic (AgSnO2) electrodes. The particles are found to have diameters between 30 and 40 nm and display smooth surfaces suggesting that they are either in liquid form or have solidified from the liquid state. Particles collected around the electrodes were analyzed by Transmission Electron Microscopy and were seen to be much larger than those seen in the SAXS measurement, to be spherical in form and composed of silver metal with irregular tin oxide particles deposited on their surface. Mixed metal nanoparticles can have important practical applications and the use of mixed sintered electrodes may be a direct method for their production

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research