Open AccessTextured MoS2 thin films obtained on tungsten: Electrical properties of the W/MoS2 contact
Author(s) -
E. Gourmelon,
J.C. Bérnède,
J. Pouzet,
Sylvain Marsillac
Publication year - 2000
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.372061
Subject(s) - x ray photoelectron spectroscopy , materials science , ohmic contact , thin film , tungsten , annealing (glass) , crystallite , molybdenum , crystallization , dangling bond , contact resistance , sputtering , substrate (aquarium) , analytical chemistry (journal) , layer (electronics) , composite material , nanotechnology , metallurgy , chemical engineering , silicon , chemistry , oceanography , chromatography , geology , engineering
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