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Probing grain boundaries in ceramic scintillators using x-ray radioluminescence microscopy
Author(s) -
Stephen R. Podowitz,
Romain Gaumé,
Robert S. Feigelson
Publication year - 2012
Publication title -
journal of applied physics
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.3676222
Subject(s) - radioluminescence , grain boundary , materials science , analytical chemistry (journal) , charge carrier , grain boundary diffusion coefficient , luminescence , scintillator , phosphor , ceramic , molecular physics , optics , chemistry , optoelectronics , microstructure , physics , metallurgy , chromatography , detector

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