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Defect enhanced optic and electro-optic properties of lead zirconate titanate thin films
Author(s) -
Min Zhu,
Zehui Du,
Jianfeng Ma
Publication year - 2011
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.3664137
Subject(s) - thin film , materials science , lead zirconate titanate , phase boundary , monoclinic crystal system , refractive index , sputtering , x ray photoelectron spectroscopy , optoelectronics , phase (matter) , ferroelectricity , dielectric , crystal structure , nanotechnology , nuclear magnetic resonance , crystallography , chemistry , physics , organic chemistry
Pb(Zr1-xTix)O3 (PZT) thin films near phase morphotropic phase boundary were deposited on (Pb0.86La0.14)TiO3-coated glass by radio frequency sputtering. A retrieved analysis shows that the lattice parameters of the as-grown PZT thin films were similar to that of monoclinic PZT structure. Moreover, the PZT thin films possessed refractive index as high as 2.504 in TE model and 2.431 in TM model. The as-grown PZT thin film had one strong absorption peak at 632.6 nm, which attributed to lead deficiency by quantitative XPS analysis. From the attractive properties achieved, electro-optic and photovoltaic characteristic of the films were carried out

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