Open AccessTrapping of implanted He at Cu/Nb interfaces measured by neutron reflectometry
Author(s) -
Mikhail Zhernenkov,
Michael S. Jablin,
Amit Misra,
M. Nastasi,
Yongqiang Wang,
Michael J. Demkowicz,
Jon K. Baldwin,
Jarek Majewski
Publication year - 2011
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.3600642
Subject(s) - neutron reflectometry , materials science , reflectometry , trapping , ion , neutron , helium , layer (electronics) , copper , analytical chemistry (journal) , atomic physics , chemistry , nanotechnology , neutron scattering , metallurgy , nuclear physics , small angle neutron scattering , time domain , ecology , physics , organic chemistry , chromatography , computer science , computer vision , biology
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom