High resolution multiple excitation spot optical microscopy | Zendy

Shilpa Dilipkumar | Zendy; Partha Pratim Mondal | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

High resolution multiple excitation spot optical microscopy

Author(s) -

Shilpa Dilipkumar,

Partha Pratim Mondal

Publication year - 2011

Publication title -

aip advances

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.421

H-Index - 58

ISSN - 2158-3226

DOI - 10.1063/1.3598413

Subject(s) - microscopy , optics , point spread function , resolution (logic) , confocal microscopy , excitation , image resolution , materials science , light sheet fluorescence microscopy , optical microscope , detector , fluorescence , super resolution microscopy , fluorescence microscope , scanning confocal electron microscopy , physics , scanning electron microscope , computer science , quantum mechanics , artificial intelligence

We propose fundamental improvements in three-dimensional (3D) resolution of multiple excitation spot optical microscopy. The excitation point spread function (PSF) is generated by two interfering counter-propagating depth-of-focus beams along the optical axis. Detection PSF is obtained by coherently interfering the emitted fluorescent light (collected by both the objectives) at the detector. System PSF shows upto 14-fold reduction in focal volume as compared to confocal, and almost 2-fold improvement in lateral resolution. Proposed PSF has the ability to simultaneously excite multiple 3D-spots of sub-femtoliter volume. Potential applications are in fluorescence microscopy and nanobioimaging

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research