Open AccessConvenient determination of concentration and energy in deep-level transient spectroscopy
Author(s) -
D. C. Look,
Z.-Q. Fang,
J. R. Sizelove
Publication year - 1995
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.358953
Subject(s) - deep level transient spectroscopy , capacitance , impurity , wafer , analytical chemistry (journal) , voltage , energy (signal processing) , activation energy , chemistry , materials science , atomic physics , physics , optoelectronics , silicon , electrode , organic chemistry , chromatography , quantum mechanics
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