Optical constants of GaxIn1−xP lattice matched to GaAs
Author(s) -
M. Schubert,
V. Gottschalch,
Craig M. Herzinger,
Huade Yao,
Paul G. Snyder,
John A. Woollam
Publication year - 1995
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.358632
Subject(s) - lattice constant , refractive index , ellipsometry , lattice (music) , materials science , chemistry , kramers–kronig relations , epitaxy , analytical chemistry (journal) , thin film , oxide , molecular physics , condensed matter physics , optics , optoelectronics , layer (electronics) , physics , nanotechnology , chromatography , diffraction , metallurgy , acoustics
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