Open AccessMicrostructure of the Cr underlayer and its effect on Sm-Co//Cr thin films
Author(s) -
Yi Liu,
B. W. Robertson,
Z. S. Shan,
S. H. Liou,
D. J. Sellmyer
Publication year - 1995
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.358559
Subject(s) - materials science , microstructure , misorientation , grain boundary , grain size , thin film , transmission electron microscopy , sputter deposition , sputtering , composite material , nanotechnology
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