Open AccessDefect characterization in GaAlInAs alloys
Author(s) -
P. Nubile,
M. Zazoui,
J. C. Bourgoin,
R. Grey,
A. Powell,
P.A. Claxton,
Peter Rockett
Publication year - 1992
Publication title -
journal of applied physics
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.351431
Subject(s) - deep level transient spectroscopy , impurity , materials science , capacitance , doping , characterization (materials science) , analytical chemistry (journal) , spectroscopy , condensed matter physics , optoelectronics , silicon , chemistry , nanotechnology , physics , electrode , organic chemistry , chromatography , quantum mechanics
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