Magnetic force microscopy with batch-fabricated force sensors | Zendy

Peter Grütter | Zendy; D. Rugar | Zendy; H. J. Mamin | Zendy; G. Castillo | Zendy; ChienJung Lin | Zendy; I. R. McFadyen | Zendy; R. M. Valletta | Zendy; Olaf Wolter | Zendy; Thomas Bayer | Zendy; J. Greschner | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

Magnetic force microscopy with batch-fabricated force sensors

Author(s) -

Peter Grütter,

D. Rugar,

H. J. Mamin,

G. Castillo,

ChienJung Lin,

I. R. McFadyen,

R. M. Valletta,

Olaf Wolter,

Thomas Bayer,

J. Greschner

Publication year - 1991

Publication title -

journal of applied physics

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.699

H-Index - 319

eISSN - 1089-7550

pISSN - 0021-8979

DOI - 10.1063/1.347856

Subject(s) - magnetic force microscope , permalloy , materials science , demagnetizing field , coercivity , magnetic field , thin film , magnetic resonance force microscopy , microscopy , magnetization , optics , nanotechnology , condensed matter physics , ferromagnetic resonance , physics , quantum mechanics

In this paper the properties of force sensors suitable for magnetic force microscopy (MFM) made by coating silicon microcantilevers with various thin magnetic films are analyzed. These MFM force sensors are batch fabricated and their magnetic properties controlled by choosing appropriate coatings. Theoretical calculations show that thin‐film MFM tips have a significantly reduced stray field, a good signal‐to‐noise ratio, and yield improved resolution when compared to etched wire tips. The sample perturbation due to the tip stray field is small, allowing the imaging of low‐coercivity samples such as Permalloy

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research