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10-nm resolution by magnetic force microscopy on FeNdB
Author(s) -
Peter Grütter,
Thomas A. Jung,
H. Heinzelmann,
A. Wadas,
Ernst Meyer,
H.R. Hidber,
H.-J. Güntherodt
Publication year - 1990
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.345675
Subject(s) - magnetic force microscope , magnetic resonance force microscopy , resolution (logic) , microscopy , materials science , magnetic domain , non contact atomic force microscopy , optics , magnetic field , condensed matter physics , nuclear magnetic resonance , molecular physics , physics , kelvin probe force microscope , magnetization , ferromagnetic resonance , quantum mechanics , artificial intelligence , computer science
Magnetic force microscopy (MFM) images of rapidly quenched FeNdB are presented. The magnetic domain structure as observed by MFM consists of elongated, polyhedral-shaped domains imaged by measuring forces smaller than 10−9 N at distances ranging from 20 to more than 200 nm. The domain transition regions, which are quite sharp and well defined, often show a double-peaked structure with a peak-to-peak distance of 10 nm. At force sensor tip-to-sample separations larger than 90 nm only a single peak is observable. It has to be assumed that the relevant effective magnetic volume of the force sensing tip is considerably smaller than the geometric dimensions as determined by scanning electron microscopy in order to understand this 10-nm resolution

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