Design of a variable temperature scanning force microscope | Zendy

Evgeny Nazaretski | Zendy; Kevin Graham | Zendy; J. D. Thompson | Zendy; Joseph A. Wright | Zendy; Denis V. Pelekhov | Zendy; P. C. Hammel | Zendy; R. Movshovich | Zendy

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Design of a variable temperature scanning force microscope

Author(s) -

Evgeny Nazaretski,

Kevin Graham,

J. D. Thompson,

Joseph A. Wright,

Denis V. Pelekhov,

P. C. Hammel,

R. Movshovich

Publication year - 2009

Publication title -

review of scientific instruments

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.605

H-Index - 165

eISSN - 1089-7623

pISSN - 0034-6748

DOI - 10.1063/1.3212561

Subject(s) - magnetic force microscope , microscope , optics , cantilever , magnetic resonance force microscopy , materials science , microscopy , atomic force acoustic microscopy , non contact atomic force microscopy , scanning hall probe microscope , scanning electron microscope , kelvin probe force microscope , physics , magnetic field , magnetization , conventional transmission electron microscope , scanning transmission electron microscopy , ferromagnetic resonance , composite material , quantum mechanics

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