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He ion irradiation damage in Al∕Nb multilayers
Author(s) -
Nan Li,
Michael Martin,
O. Anderoglu,
Amit Misra,
Lin Shao,
Haiyan Wang,
X. Zhang
Publication year - 2009
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.3138804
Subject(s) - intermetallic , transmission electron microscopy , materials science , irradiation , microstructure , fluence , hardening (computing) , radiation damage , ion , helium , sputtering , scanning electron microscope , composite material , annealing (glass) , analytical chemistry (journal) , thin film , metallurgy , layer (electronics) , atomic physics , nanotechnology , chemistry , alloy , nuclear physics , organic chemistry , chromatography , physics

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