Open AccessExcitation of atomic force microscope cantilever vibrations by a Schottky barrier
Author(s) -
Kerstin Schwarz,
U. Rabe,
S. Hirsekorn,
W. Arnold
Publication year - 2008
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.2911916
Subject(s) - cantilever , non contact atomic force microscopy , atomic force acoustic microscopy , kelvin probe force microscope , piezoresponse force microscopy , schottky barrier , conductive atomic force microscopy , materials science , force spectroscopy , resonance (particle physics) , photoconductive atomic force microscopy , chemistry , optoelectronics , magnetic force microscope , scanning capacitance microscopy , nanotechnology , atomic physics , atomic force microscopy , composite material , physics , scanning electron microscope , magnetic field , magnetization , quantum mechanics , diode , dielectric , ferroelectricity , scanning confocal electron microscopy
We have developed a method to excite cantilever vibrations for dynamic force microscopy. A n-doped silicon cantilever is coated by platinum. At the interface, a Schottky barrier forms whose depletion layer couples to the elastic strain mainly by Maxwell stress and by electrostriction. If a sinusoidal voltage is applied to the Schottky barrier, the cantilever is excited to periodic vibrations due to the transverse strain generated parallel to the length axis of the cantilever. In atomic force acoustic microscopy contact-resonance spectroscopy, this technique delivers clean resonance spectra devoid of spurious signals
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