Open AccessCantilever based optical interfacial force microscope
Author(s) -
Jeremy R. Bonander,
ByungIl Kim
Publication year - 2008
Publication title -
applied physics letters
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.2898524
Subject(s) - cantilever , optical microscope , materials science , atomic force microscopy , non contact atomic force microscopy , electrostatic force microscope , microscopy , optical force , atomic force acoustic microscopy , silicon , kelvin probe force microscope , nanotechnology , force spectroscopy , microscope , magnetic force microscope , optics , optoelectronics , composite material , optical tweezers , physics , scanning electron microscope , magnetization , quantum mechanics , magnetic field
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom