Stress in tungsten carbide-diamond like carbon multilayer coatings
Author(s) -
B. R. Pujada,
F.D. Tichelaar,
G. C. A. M. Janssen
Publication year - 2007
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.2430905
Subject(s) - materials science , tungsten carbide , bilayer , composite material , tungsten , microstructure , carbide , stress (linguistics) , diamond like carbon , compressive strength , transmission electron microscopy , diamond , sputter deposition , sputtering , metallurgy , thin film , nanotechnology , chemistry , biochemistry , linguistics , philosophy , membrane
Tungsten carbide-diamond like carbon (WC-DLC) multilayer coatings have been prepared by sputter deposition from a tungsten-carbide target and periodic switching on and off of the reactive acetylene gas flow. The stress in the resulting WC-DLC multilayers has been studied by substrate curvature. Periodicity and microstructure have been studied by transmission electron microscopy. It has been observed that compressive stress in the multilayers decreases when the bilayer thickness is reduced. Results show a minimum compressive stress for bilayer thickness of around 5?nm. This behavior is discussed in terms of interface stress and mixing between layers
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