Open AccessNear-field scanning optical microscopy and time-resolved optical characterization of epitaxial lateral overgrown c-plane and a-plane GaN
Author(s) -
Ü. Özgür,
X. Ni,
Y. Fu,
H. Morkoç̌,
Henry O. Everitt
Publication year - 2006
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.2424677
Subject(s) - epitaxy , sapphire , materials science , photoluminescence , optical microscope , optics , wide bandgap semiconductor , optoelectronics , microscopy , plane (geometry) , scanning electron microscope , laser , nanotechnology , physics , geometry , mathematics , layer (electronics) , composite material
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