Open AccessSiC-based optical interferometry at high pressures and temperatures for pressure and chemical sensing
Author(s) -
Surendramohan Dakshinamurthy,
Nathaniel R. Quick,
Aravinda Kar
Publication year - 2006
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.2191478
Subject(s) - materials science , silicon carbide , silicon , laser , wafer , optoelectronics , refractive index , silicon nitride , optics , composite material , physics
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