Open AccessX-Ray Microdiffraction as a Probe to Reveal Flux Divergences in Interconnects
Author(s) -
Ralph Spolenak
Publication year - 2006
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.2173561
Subject(s) - electromigration , interconnection , materials science , reliability (semiconductor) , microstructure , stress (linguistics) , orientation (vector space) , rotation (mathematics) , tensor (intrinsic definition) , flux (metallurgy) , computer science , composite material , metallurgy , physics , telecommunications , power (physics) , linguistics , philosophy , geometry , mathematics , quantum mechanics , artificial intelligence , pure mathematics
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