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Design and performance of a high-resolution frictional force microscope with quantitative three-dimensional force sensitivity
Author(s) -
Martin Dienwiebel,
E. de Kuyper,
Loes Crama,
J.W.M. Frenken,
J. A. Heimberg,
Dirk-Jan Spaanderman,
D. Glastra van Loon,
T. Zijlstra,
E. van der Drift
Publication year - 2005
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.1889233
Subject(s) - cantilever , microscope , calibration , highly oriented pyrolytic graphite , optics , measure (data warehouse) , materials science , resolution (logic) , non contact atomic force microscopy , astronomical interferometer , sensitivity (control systems) , atomic force microscopy , interferometry , microscopy , acoustics , physics , nanotechnology , kelvin probe force microscope , computer science , scanning tunneling microscope , quantum mechanics , database , artificial intelligence , composite material , engineering , electronic engineering

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