Spatially resolved spectra from a new x-ray imaging crystal spectrometer for measurements of ion and electron temperature profiles (invited)
Author(s) -
M. Bitter,
K. W. Hill,
B. Stratton,
A. L. Roquemore,
D. Mastrovito,
S. G. Lee,
J.G. Bak,
Myungkook Moon,
UkWon Nam,
Gregory J. Smith,
J. E. Rice,
P. Beiersdörfer,
B. S. Fraenkel
Publication year - 2004
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.1791747
Subject(s) - tokamak , plasma diagnostics , spectrometer , electron temperature , plasma , atomic physics , materials science , crystal (programming language) , physics , optics , nuclear physics , computer science , programming language
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