Simultaneous atomic force microscopy measurement of topography and contact resistance of metal films and carbon nanotubes | Zendy

Michael Stadermann | Zendy; H. Grube | Zendy; John J. Boland | Zendy; S. J. Papadakis | Zendy; Michael R. Falvo | Zendy; Richard Superfine | Zendy; S. Washburn | Zendy

Open Access

Simultaneous atomic force microscopy measurement of topography and contact resistance of metal films and carbon nanotubes

Author(s) -

Michael Stadermann,

H. Grube,

John J. Boland,

S. J. Papadakis,

Michael R. Falvo,

Richard Superfine,

S. Washburn

Publication year - 2003

Publication title -

review of scientific instruments

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.605

H-Index - 165

eISSN - 1089-7623

pISSN - 0034-6748

DOI - 10.1063/1.1590750

Subject(s) - materials science , carbon nanotube , contact resistance , graphite , conductive atomic force microscopy , tuning fork , conductivity , photoconductive atomic force microscopy , nanotechnology , silicon , atomic force microscopy , conductance , composite material , optoelectronics , scanning electron microscope , scanning capacitance microscopy , scanning confocal electron microscopy , chemistry , physics , mathematics , vibration , layer (electronics) , quantum mechanics , combinatorics

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