X-mode pulsed radar reflectometer for density fluctuation measurements on LHD | Zendy

T. Tokuzawa | Zendy; K. Kawahata | Zendy; K. Tanaka | Zendy; Y. Nagayama | Zendy; T. Kaneba | Zendy; A. Ejiri | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

X-mode pulsed radar reflectometer for density fluctuation measurements on LHD

Author(s) -

T. Tokuzawa,

K. Kawahata,

K. Tanaka,

Y. Nagayama,

T. Kaneba,

A. Ejiri

Publication year - 2003

Publication title -

review of scientific instruments

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.605

H-Index - 165

eISSN - 1089-7623

pISSN - 0034-6748

DOI - 10.1063/1.1537880

Subject(s) - reflectometry , large helical device , microwave , materials science , optics , radar , polarization (electrochemistry) , physics , plasma , time domain , telecommunications , chemistry , quantum mechanics , computer science , computer vision

A four channel pulsed radar reflectometer system has been installed on the Large Helical Device (LHD). The complicated magnetic structure in LHD causes mode conversion and/or polarization rotation of the microwaves. Pulsed radar reflectometry is a suitable reflectometric technique, because it measures the delay time of the reflected wave, not the phase, and X-mode and O-mode polarized waves can be distinguished. By using X-mode operation of the pulsed radar reflectometer so that each pulse width is about 2 ns, and the repetition rate is up to 200 kHz, the critical density where the microwave is reflected is about 1×10^16 m^?3. Also it is found that the static natural island affects the X-mode reflectometric measurements

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research