Characterization of the native Cr2O3 oxide surface of CrO2 | Zendy

Ruihua Cheng | Zendy; Bo Xu | Zendy; Camelia N. Borca | Zendy; Andrei Sokolov | Zendy; Chul–Su Yang | Zendy; Liang Yuan | Zendy; S. H. Liou | Zendy; Bernard Doudin | Zendy; P. A. Dowben | Zendy

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Characterization of the native Cr2O3 oxide surface of CrO2

Author(s) -

Ruihua Cheng,

Bo Xu,

Camelia N. Borca,

Andrei Sokolov,

Chul–Su Yang,

Liang Yuan,

S. H. Liou,

Bernard Doudin,

P. A. Dowben

Publication year - 2001

Publication title -

applied physics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.182

H-Index - 442

eISSN - 1077-3118

pISSN - 0003-6951

DOI - 10.1063/1.1416474

Subject(s) - oxide , x ray photoelectron spectroscopy , materials science , band gap , characterization (materials science) , layer (electronics) , surface (topology) , thin film , condensed matter physics , analytical chemistry (journal) , nanotechnology , chemistry , optoelectronics , nuclear magnetic resonance , metallurgy , physics , geometry , mathematics , chromatography

Using photoemission and inverse photoemission, we have been able to characterize the Cr2O3 oxide surface of CrO2 thin films. The Cr2O3 surface oxide exhibits a band gap of about 3 eV, although the bulk CrO2 is conducting. The thickness of this insulating Cr2O3 layer is twice the photoelectron escape depth which is about 2 nm thick. The effective Cr2O3 surface layer Debye temperature, describing motion normal to the surface, is about 370 K. From a comparison of CrO2 films grown by different techniques, with different Cr2O3 content, evidence is provided that the CrO2 may polarize the Cr2O3. © 2001 American Institute of Physics. [DOI: 10.1063/1.1416474

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