Parallel integration and characterization of nanoscaled epitaxial lattices by concurrent molecular layer epitaxy and diffractometry | Zendy

Tsuyoshi Ohnishi | Zendy; Daisuke Komiyama | Zendy; Takashi Koida | Zendy; Satoru Ohashi | Zendy; C. Stauter | Zendy; Hideomi Koinuma | Zendy; Akira Ohtomo | Zendy; Mikk Lippmaa | Zendy; Nobuyoshi Nakagawa | Zendy; M. Kawasaki | Zendy; Takashi Kikuchi | Zendy; Kazuhiko Omote | Zendy

Open Access

Parallel integration and characterization of nanoscaled epitaxial lattices by concurrent molecular layer epitaxy and diffractometry

Author(s) -

Tsuyoshi Ohnishi,

Daisuke Komiyama,

Takashi Koida,

Satoru Ohashi,

C. Stauter,

Hideomi Koinuma,

Akira Ohtomo,

Mikk Lippmaa,

Nobuyoshi Nakagawa,

M. Kawasaki,

Takashi Kikuchi,

Kazuhiko Omote

Publication year - 2001

Publication title -

applied physics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.182

H-Index - 442

eISSN - 1077-3118

pISSN - 0003-6951

DOI - 10.1063/1.1385587

Subject(s) - heterojunction , materials science , epitaxy , diffractometer , characterization (materials science) , fabrication , electron diffraction , thin film , nanotechnology , layer (electronics) , reflection (computer programming) , crystal structure , lattice (music) , diffraction , optoelectronics , crystallography , optics , chemistry , computer science , physics , programming language , pathology , medicine , alternative medicine , acoustics

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