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Flux lattice imaging of a patterned niobium thin film
Author(s) -
M. Roseman,
Peter Grütter,
A. Badı́a,
V. Metlushko
Publication year - 2001
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.1355327
Subject(s) - flux pinning , magnetic flux , superconductivity , condensed matter physics , niobium , magnetic force microscope , meissner effect , materials science , magnetic field , type ii superconductor , superdiamagnetism , thin film , penetration depth , pinning force , flux (metallurgy) , lattice (music) , microscope , demagnetizing field , optics , magnetization , high temperature superconductivity , physics , nanotechnology , critical current , quantum mechanics , acoustics , metallurgy
Using our cryogenic magnetic force microscope, we have investigated a superconducting Nb thin film, 100 nm in thickness with Tc~6.5 K. The film is patterned with a square array (1 μm×1 μm) of antidots, which serve as artificial pinning centers for magnetic flux. We have observed flux lattice matching as a function of applied magnetic field and temperature, for field strengths up to the third matching field, with evidence of flux dragging by the tip around the antidots. Force gradient distance curves acquired at temperatures about Tc clearly demonstrate an observable Meissner force between tip and sample, and allow for an estimation of the magnetic screening penetration depth

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