Open AccessMeasurement of the complex dielectric constant down to helium temperatures. I. Reflection method from 1 MHz to 20 GHz using an open ended coaxial line
Author(s) -
H. C. F. Martens,
J. Reedijk,
H. B. Brom
Publication year - 2000
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.1150226
Subject(s) - dielectric , materials science , reflection coefficient , reflection (computer programming) , optics , admittance , calibration , microwave , coaxial , helium , aperture (computer memory) , wafer , electrical impedance , computational physics , acoustics , optoelectronics , physics , atomic physics , computer science , telecommunications , quantum mechanics , programming language
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