Open AccessNovel charge integrating pulsed I(V) technique: A measurement of Fowler–Nordheim currents through thin SiO2 films
Author(s) -
Jordan C. Poler,
W. S. Woodward,
E. A. Irene
Publication year - 1993
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.1144159
Subject(s) - quantum tunnelling , materials science , capacitor , characterization (materials science) , optoelectronics , thin film , electron , semiconductor , voltage , current (fluid) , condensed matter physics , nanotechnology , electrical engineering , physics , quantum mechanics , engineering
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