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Submicron entrance windows for an ultrasoft x-ray camera
Author(s) -
H. Huizenga,
J. A. M. Bleeker,
W. H. Diemer,
A. P. Huben
Publication year - 1981
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.1136661
Subject(s) - optics , materials science , extreme ultraviolet , wavelength , window (computing) , radiation , leakage (economics) , ionization , irradiation , physics , computer science , ion , laser , quantum mechanics , economics , macroeconomics , operating system , nuclear physics

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