Direct observation of chemical vapor deposited diamond films by atomic force microscopy
Author(s) -
Vı́tor Baranauskas,
Makoto Fukui,
Cristiano Rodrigues,
Nivaldo Antônio Parizotto,
V.J. Trava-Airoldi
Publication year - 1992
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.107253
Subject(s) - diamond , chemical vapor deposition , silicon , materials science , atomic force microscopy , conductive atomic force microscopy , material properties of diamond , microscopy , analytical chemistry (journal) , nanotechnology , chemistry , optoelectronics , composite material , optics , physics , chromatography
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