Open AccessContact resonance frequencies and their harmonics in scanning probe microscopy
Author(s) -
MurilloBracamontes Eduardo A.,
GervacioArciniega Juan J.,
CruzValeriano Edgar,
EnríquezFlores Christian I.,
PalominoOvando Martha A.,
YañezLimón José M.,
Siqueiros Jesús M.,
Cruz M. Paz
Publication year - 2021
Publication title -
iet science, measurement and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.418
H-Index - 49
eISSN - 1751-8830
pISSN - 1751-8822
DOI - 10.1049/smt2.12042
Subject(s) - piezoresponse force microscopy , atomic force acoustic microscopy , non contact atomic force microscopy , materials science , scanning probe microscopy , cantilever , microscopy , acoustic microscopy , conductive atomic force microscopy , ferroelectricity , kelvin probe force microscope , scanning capacitance microscopy , harmonics , scanning force microscopy , magnetic force microscope , optics , scanning electron microscope , optoelectronics , nanotechnology , atomic force microscopy , scanning confocal electron microscopy , composite material , physics , electrical engineering , voltage , magnetic field , dielectric , engineering , quantum mechanics , magnetization
Local characterizations of electric, magnetic, mechanical, electrochemical, and structural properties of materials by scanning probe microscopy (SPM) can be carried out by sensing variations of the contact cantilever's resonance frequencies, resulting in diverse microscopy techniques such as piezoresponse force microscopy (PFM), atomic force acoustic microscopy (AFAM) and piezomagnetic force microscopy (PmFM), to name a few. In this work, we provide a simple setup to determine such frequencies, together with the dynamic response of the SPM cantilever and its harmonics. The setup is less expensive when compared to the commercial versions and allows a better control of the in‐and‐out PFM. It is based on the use of the internal AC source of a lock‐in amplifier controlled by software developed in LabVIEW. In order to illustrate the utility of the contact resonance frequencies in the SPM, resonance‐PFM, PFM non‐linearities, discrimination of ferroelectric from non‐ferroelectric responses and PmFM measurements, and determination of the modulus of elasticity by AFAM are conducted.