Open AccessRecent development of samples’ surface properties using scanning ion conductance microscopy
Author(s) -
Li Zhenhui,
Xu Ke,
Wei Fanan
Publication year - 2019
Publication title -
micro and nano letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.25
H-Index - 31
ISSN - 1750-0443
DOI - 10.1049/mnl.2019.0038
Subject(s) - scanning ion conductance microscopy , scanning probe microscopy , microscopy , materials science , conductance , scanning electron microscope , scanning capacitance microscopy , scanning confocal electron microscopy , nanotechnology , conductive atomic force microscopy , ion , conductivity , analytical chemistry (journal) , chemistry , optics , atomic force microscopy , composite material , physics , organic chemistry , condensed matter physics , chromatography
Scanning ion conductance microscopy has a widespread application in imaging non‐conductive substrates, especially biological samples due to its high‐resolution and non‐contact imaging. In this work, state‐of‐the‐art achievements on exploring samples’ surface properties including surface morphology, sample conductivity and dynamics using scanning ion conductance microscopy are firstly introduced, which confirm that scanning ion conductance microscopy is such a mature technology that realises non‐invasive and high‐resolution imaging. Then, combinations with scanning electrochemical microscopy and atomic force microscopy are demonstrated, which realise the multifunction of scanning ion conductance microscopy. Furthermore, improvements that can help enhance the imaging rate are presented. Finally, the future direction of scanning ion conductance microscopy is discussed.