Open AccessElectrical and optical properties of metal‐sandwiched ZnO/Ti/Cu/Ti/ZnO transparent conductive thin film
Author(s) -
Lin Qijing,
Zhao Na,
Jiang Zhuangde,
Meng Qingzhi,
Chen Feng
Publication year - 2018
Publication title -
micro and nano letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.25
H-Index - 31
ISSN - 1750-0443
DOI - 10.1049/mnl.2018.5234
Subject(s) - materials science , annealing (glass) , sheet resistance , figure of merit , transmittance , sputter deposition , thin film , titanium , sputtering , copper , optoelectronics , zinc , composite material , transparent conducting film , metal , electrical resistivity and conductivity , electrical conductor , metallurgy , nanotechnology , layer (electronics) , engineering , electrical engineering
Metal‐sandwiched zinc oxide (ZnO)/titanium (Ti)/copper (Cu)/Ti/ZnO thin film systems were fabricated using magnetron sputtering technology and then annealed using a rapid thermal annealing system at temperatures from 100 to 400°C. The influence of the Ti film thicknesses and annealing temperatures on the surface morphologies, sheet resistance and optical properties were studied. The surface morphologies change a little with the annealing temperature rises. The sheet resistances reduce with the Ti film thickness or annealing temperature increasing. Both the max transmittance and figure of merit reduce with the increase of Ti film thickness. The max transmittance increases with the temperature increasing from 100 to 300°C and then reduces. However, the figure of merit increases with the temperature increasing which indicates that the metal‐sandwiched ZnO/Ti/Cu/Ti/ZnO thin film system annealed at 400°C has the optimal performance.