Open AccessBlind evaluation of AFM tip shape by using optical glass surface with irregular nanostructures as a tip characteriser
Author(s) -
Han Guoqiang,
Cao Shuguang,
Wang Xiumei,
Lin Bo,
Chen Yuqin
Publication year - 2017
Publication title -
micro and nano letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.25
H-Index - 31
ISSN - 1750-0443
DOI - 10.1049/mnl.2017.0200
Subject(s) - polishing , materials science , atomic force microscopy , nanostructure , optics , abrasive , resolution (logic) , scanning probe microscopy , conductive atomic force microscopy , optical microscope , microscopy , nanotechnology , composite material , scanning electron microscope , physics , computer science , artificial intelligence
Atomic‐force microscopy (AFM) is a type of scanning probe microscopy. It possesses nano‐scale resolution which is >1000 times better than the optical diffraction limit. An image of AFM is the result of interaction between the tip and the sample. The AFM image is not accurate and distorted due to the finite size of the probe tip. To correct the AFM image and acquire accurate sample morphology information, it needs to evaluate the tip shape and status. The shape of the probe tip is calculated to determine the quality of the probe. The optical glass surface fabricated by free abrasive polishing (traditional mechanical polishing) technique is used as a new tip characteriser to calibrate the AFM probe tip. Meanwhile, an improved blind reconstruction algorithm is adopted to calculate the AFM tip shape and size. In the help of matrices, the blind reconstruction algorithm is elaborated clearly. The optical glass surface with irregular nanostructures ensures that the morphology of probe tip can be determined accurately. Without independent knowledge of the sample morphology, the three‐dimensional morphology of the AFM tip can be obtained.