Open AccessError compensation in atomic force microscope scanned images
Author(s) -
Rana Md. Sohel,
Pota Hemanshu R.,
Petersen Ian R.
Publication year - 2016
Publication title -
micro and nano letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.25
H-Index - 31
ISSN - 1750-0443
DOI - 10.1049/mnl.2015.0383
Subject(s) - control theory (sociology) , compensation (psychology) , scanner , mimo , atomic force microscopy , controller (irrigation) , vibration , model predictive control , computer science , piezoelectricity , work (physics) , materials science , physics , acoustics , engineering , control (management) , nanotechnology , mechanical engineering , artificial intelligence , psychology , computer network , channel (broadcasting) , psychoanalysis , agronomy , biology
The design of a multi‐input–multi‐output (MIMO) model predictive control (MPC) framework for reducing errors in images scanned by an atomic force microscope (AFM) is presented. To improve the damping capability of the proposed control framework, it is augmented with a damping compensator. The MIMO form of this control framework compensates the tilted natures of the scanned images by compensating the cross‐coupling effect while its augmented damping compensator reduces the vibration effect by improving damping in the resonant mode of the AFM's piezoelectric tube scanner. Experimental results using the existing AFM proportional–integral controller and single‐input–single‐output MPC are also presented to show the effectiveness of the MIMO MPC controller. This Letter is an extension of an authors’ earlier published work.