Open AccessMethod of carbon‐based electrode analysis by conductive‐atomic force microscopy
Author(s) -
Majchrzycki Ł.,
Nowicki M.,
Czajka R.,
Lota K.
Publication year - 2014
Publication title -
micro and nano letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.25
H-Index - 31
ISSN - 1750-0443
DOI - 10.1049/mnl.2013.0683
Subject(s) - conductive atomic force microscopy , materials science , electrode , atomic force microscopy , nanotechnology , electrical conductor , microscopy , carbon fibers , photoconductive atomic force microscopy , analytical chemistry (journal) , chemical engineering , composite material , chemistry , scanning capacitance microscopy , scanning confocal electron microscopy , optics , environmental chemistry , engineering , physics , scanning electron microscope , composite number
A novel method of the characterisation of composite materials for electrochemical capacitor electrodes by conductive ‐ atomic force microscopy is reported. The method allowed the analysis of the structure and the distribution of the non ‐ conductive or less conductive additives dispersed in the carbon conductive matrix, which affect the surface conductivity of the electrodes. The composites of activated carbon with nickel (II) oxide, as well as activated carbon or carbon nanotubes with three different conducting polymers – polyaniline, poly(3,4 ‐ ethylenedioxythiophene) and polypyrrole – were prepared and tested and analysed by the reported method.