Open Access2D scattering centre intensity pre‐estimated method based on matrix pencil method
Author(s) -
Wang Jun,
Lu Yao,
Wei Shaoming
Publication year - 2019
Publication title -
the journal of engineering
Language(s) - English
Resource type - Journals
ISSN - 2051-3305
DOI - 10.1049/joe.2019.0215
Subject(s) - scattering , matrix pencil , pencil (optics) , intensity (physics) , scattering parameters , matrix (chemical analysis) , position (finance) , optics , reflection (computer programming) , physics , mathematics , computational physics , computer science , materials science , economics , composite material , programming language , eigenvalues and eigenvectors , finance , quantum mechanics
The accuracy of ultra wide band (UWB) scattering centre parameter estimation is the key bases in the study of target classification and identification. A novel 2D scattering centre parameter estimation algorithm for microwave chamber target is presented here. First, by using GTD model, this method constructs the microwave chamber measured data. Second, using matrix pencil method to build Hankel Matrix as a mathematic progress to estimate position parameter of scattering centres. Third, the type parameter and reflection intensity are estimated based on the least square method and principal components analysis. Using pre‐estimated reflection intensity and clean technique to correctly determine scattering centre number and precisely estimate the reflection intensity of every scattering centres even if the intensity gap between the scattering centres is huge. The simulation results show that this novel approach can accurately and effectively determine the number and the parameters of the scattering centres. The Cramer–Rao lower bound (CRLB) is also given.