Open AccessAdvanced simulation of IEDs
Author(s) -
Schossig Thomas
Publication year - 2018
Publication title -
the journal of engineering
Language(s) - English
Resource type - Journals
ISSN - 2051-3305
DOI - 10.1049/joe.2018.0214
Subject(s) - iec 61850 , computer science , firmware , automation , model based testing , acceptance testing , embedded system , integration testing , systems engineering , reliability engineering , software engineering , test case , software , engineering , operating system , mechanical engineering , regression analysis , machine learning
IEC 61850 is the established standard for substation communication. Since the standard describes different stages of lifecycle of Substation Automation Systems the demands for specification, testing, and especially simulation differ. The approach described in this study can be used in the different stages and fulfil practical requirements. It describes the requirements for simulation and proposes an implementation applicable. If a single Intelligent Electronic Device (IED) and its data model to be simulated in technical investigation phase is sufficient at Factory Acceptance Testing and Site Acceptance Testing multiple IEDs and utilised services as GOOSE and reports will be needed. In addition, the methods described for indicating test mode/behaviour and simulation indication become important. The simulation has to be embedded in testing environment and interact with tools to be used for visualisation of changes in IED's data model. Advanced services in IEC 61850 like setting groups control, switching device control and file transfer have to be added. The requirements will be discussed from a utility's perspective. The method described can be extended for routine testing and maintenance testing, e.g. after firmware upgrades. An outlook develops a vision to be utilised for automation and control testing.