Open AccessReliability evaluation method for distribution network
Author(s) -
Liu Ningbo,
Wu Tiantian,
Xu Tao,
Ma Yan
Publication year - 2017
Publication title -
the journal of engineering
Language(s) - English
Resource type - Journals
ISSN - 2051-3305
DOI - 10.1049/joe.2017.0636
Subject(s) - reliability (semiconductor) , node (physics) , probabilistic logic , computer science , reliability engineering , statistic , voltage , line (geometry) , power (physics) , mathematics , engineering , statistics , electrical engineering , physics , quantum mechanics , geometry , structural engineering , artificial intelligence
To evaluate the impact on the voltage quality and line carrying capacity of distribution network with distributed photovoltaic (PV), this study proposed a reliability evaluation method based on probabilistic load flow (PLF). Based on an improved point estimation method, the probabilistic statistic values of voltages and line power would be derived via the solution of PLF. Combined with cumulant and Cornish‐Fisher series expansion, the probability distribution of node voltage and line flow was obtained. On this basis, the sensitivity index was proposed to characterise the most affected node or branch by adding the distributed PV in the distribution network, which was used to locate the weak point of the distribution network accurately. In addition, the reliability evaluation indexes were established to achieve probabilistic evaluation of voltage quality and line carrying capacity of distribution network. In the end, taking the modified IEEE 34 bus test system as the case, the property of the proposed method about the probabilistic evaluation of the distribution network with distributed PV was verified.