Open AccessMeasuring dielectric properties by two methods using software‐defined radio
Author(s) -
Lourenço Chuma Euclides,
Iano Yuzo,
Roger Leonardo Lorenzo Bravo,
Fontgalland Glauco
Publication year - 2019
Publication title -
iet science, measurement and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.418
H-Index - 49
eISSN - 1751-8830
pISSN - 1751-8822
DOI - 10.1049/iet-smt.2018.5094
Subject(s) - dissipation factor , dielectric , resonator , dielectric resonator , microwave , software , acoustics , radio frequency , materials science , electronic engineering , software defined radio , microwave cavity , resonance (particle physics) , computer science , optoelectronics , telecommunications , engineering , physics , particle physics , programming language
Two methods for measuring the dielectric constant and loss tangent of the dielectric materials using software‐defined radio (SDR) are presented, which may be used as an alternative to the expensive vector network analysers (VNA). The first method used was the cylindrical cavity resonator designed for a resonance frequency of 2.5 GHz. The second method used was the complementary split ring resonator designed for a resonance frequency of 1.25 GHz. In both cases, measurements were carried out using VNA and SDR to compare the efficiency of both tools. The measurement accuracy was assessed by comparing the results with the declared values in the data sheets of dielectric manufacturers. The results showed a good agreement with the available data sheet values and further demonstrated that the SDR is an excellent tool for microwave measurements.