Open AccessHigh‐sensitivity structure for the measurement of complex permittivity based on SIW
Author(s) -
Yang Xiaoqing,
Xin Lei,
Jiao Xingmin,
Zhou Peiping,
Wu Shiyue,
Huang Kama
Publication year - 2017
Publication title -
iet science, measurement and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.418
H-Index - 49
eISSN - 1751-8830
pISSN - 1751-8822
DOI - 10.1049/iet-smt.2016.0361
Subject(s) - permittivity , sensitivity (control systems) , materials science , relative permittivity , dielectric , resonator , scattering parameters , waveguide , optoelectronics , substrate (aquarium) , split ring resonator , characterization (materials science) , electronic engineering , engineering , nanotechnology , oceanography , geology
In this study, a substrate integrated waveguide (SIW) combined with complementary split‐ring resonator (CSRR) structure is proposed for high‐sensitivity measurement of complex permittivity of low loss material at 2.45 GHz. The simulated results demonstrated that the small changes can be sensed through loading the CSRR structure on both sides of SIW. Then, the experiments are performed on various dielectric samples to validate the proposed structure by measuring the particulate samples with different moisture contents and solution samples in different mixed volume ratio. The measured results show that the sensitivity of the proposed SIW with CSRR structure is always higher than the structure without CSRR. Furthermore, neural network based on actual experimental scattering parameters is used for obtaining the permittivity of samples under test. The experimental values agree well with the theoretical values, and the relative errors ofε ′andε ′ ′are <5 and 10%.