Open AccessSwitch fault diagnosis and capacitor lifetime monitoring technique for DC–DC converters using a single sensor
Author(s) -
Givi Hadi,
Farjah Ebrahim,
Ghanbari Teymoor
Publication year - 2016
Publication title -
iet science, measurement and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.418
H-Index - 49
eISSN - 1751-8830
pISSN - 1751-8822
DOI - 10.1049/iet-smt.2015.0256
Subject(s) - capacitor , converters , fault (geology) , electrolytic capacitor , switched capacitor , electronic engineering , fault detection and isolation , electrical engineering , electromagnetic coil , engineering , power (physics) , fault current limiter , computer science , voltage , electric power system , seismology , geology , actuator , physics , quantum mechanics
Owing to the key role of the power electronic converters in various applications, their reliability is an important issue. The electrolytic capacitor and the power switch are the most vulnerable components of the converters. On fault occurrence in these components, a suitable remedial strategy should be employed to prevent further damages. The first step in any remedial strategy is fault diagnosis including fault detection and identification. This study proposes a technique for switch fault diagnosis and capacitor lifetime monitoring in non‐isolated single‐switch DC–DC converters. The proposed cost‐effective method could be easily implemented using a printed circuit board Rogowski coil (PCBRC) on the capacitor terminals. The derivative of the capacitor current is captured by the PCBRC. The captured signal contains suitable signatures for detection of switch open‐circuit and short‐circuit faults. In addition to switch fault detection, lifetime of the converter capacitor is also monitored by the PCBRC via calculation of the capacitor equivalent series resistance. The proposed technique is implemented for a buck converter. The experimental results confirm the capability of the proposed technique for switch fault diagnosis and capacitor lifetime monitoring in non‐isolated single‐switch DC–DC converters.