Open AccessRadiated spurious emission measurements using fast Fourier transform‐based time domain scan
Author(s) -
Sim Zhi Wei,
Song Jian
Publication year - 2015
Publication title -
iet science, measurement and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.418
H-Index - 49
eISSN - 1751-8830
pISSN - 1751-8822
DOI - 10.1049/iet-smt.2014.0333
Subject(s) - spurious relationship , time domain , fourier transform , fast fourier transform , frequency domain , gsm , electronic engineering , acoustics , computer science , materials science , physics , algorithm , telecommunications , engineering , computer vision , quantum mechanics , machine learning
In this study, the use of time domain (TD) scan based on fast Fourier transform technique for radiated spurious emission (RSE) measurements is investigated. Measurement time and results of TD scan are compared with those of conventional frequency sweep method. The RSE measurements carried out are based on two different wireless technologies, that is, GSM 900 and GSM 1800. The findings show that the TD scan can reduce overall RSE test time up to 86% with comparable measurement results.