
Flaw detection and measurement for mobile display
Author(s) -
Wang YaoChin,
Lin BorShyh
Publication year - 2014
Publication title -
iet science, measurement and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.418
H-Index - 49
eISSN - 1751-8830
pISSN - 1751-8822
DOI - 10.1049/iet-smt.2013.0190
Subject(s) - computer science
With advanced small‐pixel and high‐resolution mobile displays, the display are obtaining smaller pixel size and higher resolution on thin‐film‐transistor (TFT) array process. This study proposed the flaw detection and measurement in small pixel design mobile displays based on oxide‐semiconductor‐based TFT liquid crystal displays. The measurement is with respect to electrical‐physic characterisation metrics and observer studies. Studies resulted in small‐sized pixel TFT array between the flaw detection performance and maker preference approaches. Detection performance factors provided information on the differences among small pixel design for advanced mobile display technologies. The results of the detection performance and preference study showed that the application for advanced mobile display panels. It also shown that critical pixel defect played an important role than previously seen in non‐small pixel TFT array panels for managing process yield. The method of voltage imaging for detection, developed in this study provides an initial insight into the high resolution of small‐sized pixel designs for advanced mobile displays with precision and diagnostic images in portable devices.